View cart “EM-Tec FG-1 Silicon Finder Grid Substrate with 144 fields of 1x1mm” has been added to your cart.
JEOL Ã9.5×9.5mm angled SEM sample stub with 45 degree, aluminium
$30.63
SKU: 10-005105-10
Categories: JEOL SEM Stubs, SEM Sample Stubs
Related products
-

Low profile Zeiss pin stub Ø12.7 diameter with 1mm height, short pin, aluminium
$13.13 – $118.13 Select options This product has multiple variants. The options may be chosen on the product page View Product -

SEM pin stub Ø12.7 diameter top, standard pin, copper
$27.65 – $51.63 Select options This product has multiple variants. The options may be chosen on the product page View Product -

SEM pin stub Ø63 diameter top, standard pin, aluminium
$25.38 – $113.75 Select options This product has multiple variants. The options may be chosen on the product page View Product -

SEM pin stub Ø12.7 diameter top, with flat, standard pin, aluminium
$13.83 – $126.00 Select options This product has multiple variants. The options may be chosen on the product page View Product
