View cart “EM-Tec FG-1 Silicon Finder Grid Substrate with 144 fields of 1x1mm” has been added to your cart.
JEOL Ã25x16mm angled SEM sample stub with 45 degree, aluminium
$45.50
SKU: 10-005127-10
Categories: JEOL SEM Stubs, SEM Sample Stubs
Related products
-

SEM pin stub Ø63 diameter top, standard pin, aluminium
$25.38 – $113.75 Select options This product has multiple variants. The options may be chosen on the product page View Product -

Low profile Zeiss pin stub Ø12.7 diameter with 36° for Zeiss SEM/ FIB systems, short pin, aluminium
$22.75 – $203.88 Select options This product has multiple variants. The options may be chosen on the product page View Product -

SEM pin stub Ø25.4 diameter top, standard pin, aluminium
$33.25 – $301.00 Select options This product has multiple variants. The options may be chosen on the product page View Product -

SEM pin stub Ø12.7 diameter top, standard pin, aluminium
$26.08 – $236.25 Select options This product has multiple variants. The options may be chosen on the product page View Product
