Edge Scientific
Menu
About Edge
Opportunities
News & Events
Products
Web Store
Partners
Contact
Diatome Knives
Home
/
Calibration
/
SEM / FIB Magn. Calibration
/
Magnification Calibration MCS-0.1
/ EM-Tec MCS-0.1TR traceable calibration standard, 2.5mm to 100nm, unmounted
View cart
“EM-Tec M-1 calibration standard with 1µm grid pattern, mounted on 12.2mm JEOL stub” has been added to your cart.
EM-Tec MCS-0.1TR traceable calibration standard, 2.5mm to 100nm, unmounted
$
678.13
EM-Tec MCS-0.1TR traceable calibration standard, 2.5mm to 100nm, unmounted quantity
Add to cart
SKU:
31-T32000-U
Categories:
Calibration
,
Magnification Calibration MCS-0.1
,
SEM / FIB Magn. Calibration
Related products
EM-Tec M-1 calibration standard with 1µm grid pattern, mounted on 15mm Hitachi stub
$
183.75
Add to cart
View Product
EM-Tec MCS-1CF certified calibration standard, 2.5mm to 1µm, mounted on custom stub
$
1,270.86
Add to cart
View Product
TipCheck AFM tip test sample on 12mm AFM disc
$
401.63
Add to cart
View Product
HS-500MG AFM XYZ calibration standard, 500nm Z, mounted on 12mm AFM disc
$
420.00
Add to cart
View Product